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Test Generation for Partial Scanned Sequential Circuits Based on Boolean Function Manipulation
Choi Ho Yong The Transactions of the Korea Information Processing Society (1994 ~ 2000),
Vol. 3, No. 3, pp. 572-580,
Apr.
1996
10.3745/KIPSTE.1996.3.3.572
10.3745/KIPSTE.1996.3.3.572
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KTCCS is also selected as the Journal for Accreditation by NRF (National Research Foundation of Korea).
